Friday, June 8, 2012

DAC 2012: Interview with EE Times

DAC was quite busy this year at the Moscone center in San Francisco.
It was a good way to test market demand for Soft Error solutions, or at least the interest of different industries about this reliability problem. Whereas many are aware of the problem, more than ever see it as a concern and try to be proactive about it. Summary of concerned markets is shown in this snapshot taken from the graphics on our booth:
We've also been interviewed by EETimes online TV. You can see the it here.

No comments:

Post a Comment